Discussion on: IoT-based Yield Monitoring of Mulberry Silkworm Using Image Processing Technique

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Article Title

IoT-based Yield Monitoring of Mulberry Silkworm Using Image Processing Technique

Authored by

N. Vairam
Department of Agriculture Engineering, SRM Valliammai Engineering College, India.

D. Hari Kishore
Department of Agriculture Engineering, SRM Valliammai Engineering College, India.

S. Mukesh Kumar
Department of Agriculture Engineering, SRM Valliammai Engineering College, India.

A. Sakthivel
Department of Agriculture Engineering, SRM Valliammai Engineering College, India.

DOI or Article Link

https://doi.org/10.9734/jsrr/2025/v31i53002

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