Discussion on: Comprehensive Analysis of Trait Associations and Path Coefficients for Yield, Quality, and Biotic Stress Resistance in Onion (Allium cepa L.) Genotypes under Short-Day Conditions

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Article Title
Comprehensive Analysis of Trait Associations and Path Coefficients for Yield, Quality, and Biotic Stress Resistance in Onion (Allium cepa L.) Genotypes under Short-Day Conditions
Authored by

Bandari Naresh
Department of Vegetable Science, Faculty of Horticulture, Bidhan Chandra Krishi Viswavidyalaya, Mohanpur, Nadia, West Bengal – 741252, India.

Umesh Thapa
Department of Vegetable Science, Faculty of Horticulture, Bidhan Chandra Krishi Viswavidyalaya, Mohanpur, Nadia, West Bengal – 741252, India.

Dachani Sruthi
School of Agricultural Science, Mallareddy University, Hyderabad – 500014, India.

DOI or Article Link

https://doi.org/10.9734/jsrr/2025/v31i123774

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